SOFTWARE

Mapvision Editor Suite

Editor Suite allows operators, quality managers and other dedicated Mapvision Quality Gate users make changes to the inspection program settings independently at the production site.

  • Add new inspection points
  • Update nominals and tolerances
  • Fine-tune the measurement program
  • Conduct measurement reference updates
Pattern_editor

Respond to Change Requests Immediately

With Editor Suite, respond immediately to any change requests, for example, updating feature names, adding new inspection points to the existing program, or even conducting reference updates.

Reduce Costs with Shorter Response Times

Deploying engineering change requests (ECRs) are time consuming activities and time is costly for a fast-paced manufacturing line. With Editor Suite, update the inspection program within minutes instead of hours and take advantage of Quality Gate immediately to measure process performance after the line adjustments – reducing line downtime.

Complete Trainings and Onboarding

Our experts provide extensive trainings and fully onboard your personnel without any additional costs.

Light

  • Checkmark Fine tune the measurement program
  • Checkmark Edit feature names
  • Checkmark Re-run measurements from stored images and validate offset adjustments

Standard

  • Checkmark Fine tune the measurement program
  • Checkmark Edit feature names
  • Checkmark Re-run measurements from stored images and validate offset adjustments
  • Checkmark Conduct reference updates
  • Checkmark Update the visual inspection program for presence checks

Extended

  • Checkmark Fine tune the measurement program
  • Checkmark Edit feature names
  • Checkmark Re-run measurements from stored images and validate offset adjustments
  • Checkmark Conduct reference updates
  • Checkmark Update the visual inspection program for presence checks
  • Checkmark Fully manage and update the inspection settings
  • Checkmark Add new features and measurement points
  • Checkmark Update nominals and tolerances
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Adding New Points and Distance Measurement

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Programming for Multiple Features